FTI 1000 Tester Key Features and Benefits

–          Open-Source Software Architecture

• Full access to Test Function Library ‘C’ Code

–          Scalability:

• Lower capital cost
• Higher Throughput

–          Flexible Configurations

• Higher Handler Productivity
• Multisite Test of CSP Packages
• Multidie Test for Wafer Probing
• High Voltage IC Test Capability

–          Focused Technology

• Integrated DC+AC Discrete test
• Floating Power Instruments
• Lowest Cost of Test per Device