FTI 1000 Power Discrete Test System for MIL Standard Diode Testing

The FTI 1000 test system can be configured to test diodes and TVS devices according to

MIL Standard 750.

Test methods include:

• 3101-Thermal Impedance – Ztheta, Thermal Resistance
• 4051 – Dynamic Impedance – Zzt/Zzk
• 4065 – Peak Reverse Power  – Prp
• 4066 – Surge Current Test – square wave, half-sine wave
• Exponential Surge Current Test – 8/20, 10/1000
• PRF 19500-533 – Noise Density

FTI 3000 Zener Diode Burn-In and Test System

The FTI 3000 system performs continuous burn-in and test on Zener Diode arrays by maintaining Tj and measuring Vf, Vz and Is.

It conforms to MIL-PRF-19500/356 Rev K