White Papers and Application Notes

Focused Test Inc. public Whitepapers and Application Notes:

This application note reviews the basic principles surrounding unclamped inductive switching (UIS). Power MOSFET’s inherently have extremely fast switching speeds. As a result, designers often use them in high speed switching circuits which take advantage of this capability. This application note discusses the methods for testing Avalanche Ruggedness.

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DVSD is the difference of two VSD (body diode voltage drop) measurements done before and after heating up the device for a certain period (heating time).

Part Average Test, also known as PAT, is a tool in FTI Studio™ that implements AEC Q001 Rev C.

Using the SOA or HP module, the Safe Operating Area test applies a given power to the MOSFET device under test (DUT) for a given pulse width.

This application note reviews the basic principles surrounding unclamped inductive switching (UIS). Power MOSFET’s inherently have extremely fast switching speeds. As a result, designers often use them in high speed switching circuits which take advantage of this capability. This application note discusses the methods for testing Avalanche Ruggedness.

Using the Bipolar Junction Transistor hFE test, the FTI-1000 applies a programmable voltage from the Emitter to Collector of the Device Under Test, or DUT. A low power current source then ramps the base current while the collector current is monitored. Once the programmed collector current is reached, power is removed, and the HFE is calculated using the programmed collector current, and applied base current.

The NI GPIB controllers for PCI and PXI combine high-performance hardware with a complete suite of development tools to get your applications up and running fast.

Using the FTI-1000 in conjunction with the Diode Test Station, the ZZk and ZZt tests apply a modulated current through the zener diode device under test (DUT) for a given pulse width. Simultaneously the voltage is measured across the DUT from which the impedance can be calculated. To differentiate between the ZZk “knee impedance” test, and ZZt “zener breakdown impedance” test, each have an independent, and fully programmable Ir current bias setting.