FTI 1000 Power Discrete Test System for MIL Standard Diode Testing
The FTI 1000 test system can be configured to test diodes and TVS devices according to
Test methods include:
- 3101-Thermal Impedance – Ztheta, Thermal Resistance
- 4051 – Dynamic Impedance – Zzt/Zzk
- 4065 – Peak Reverse Power – Prp
- 4066 – Surge Current Test – square wave, half-sine wave
- Exponential Surge Current Test – 8/20, 10/1000
- PRF 19500-533 – Noise Density
FTI 3000 Zener Diode Burn-In and Test System
The FTI 3000 system performs continuous burn-in and test on Zener Diode arrays by maintaining Tj and measuring Vf, Vz and Is.
It conforms to MIL-PRF-19500/356 Rev K